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논문검색

반도체 검사 운영 효율성 향상 방안 : 전용 및 범용 장비의 할당과 생산의 연속성을 감안한 투입 관점을 중심으로

원문정보

Semiconductor Inspection Operation Efficiency Improvement Plan : Focusing on the allocation of dedicated and general-purpose equipment and the perspective of input considering the continuity of production

이호경

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초록

영어

Semiconductors are used in almost all electronic products today, and their demand is increasing as the number of uses increases with the development of technology. Also, the semiconductor features become extremely complicated and diversified. For semiconductor companies, the rapidchangesrequirea large amount of machine investments, and will add up the manufacturing cost as well as affect the entiremarg in structure negatively. Especially, the semiconductor testhasto bedesigned tomeetthespeed, functionality and feature of the device under test,makingitverydifficulttostandardizeacrossvarioussemiconductordevices. The out sourcingmanufacturersconsiderthecapitalexpendituresforthetestoperationistheoneofthemost challenging decision. In this paper, externalinstabilityfactorssuchaswafer supply disconnection and customer demand change sareexcluded as much as possible in the finalteststage of semiconductor production, and the correlation between facility operation rate saccording to various input scenariosis studied. Through this, efficient allocation of dedicated and general-purpose facilities increases the facility utilization rate, thereby reducing the buffer capacity. As a result, it is possible to prevent excessive facility investment, reduce corporate losses, and establish and implement stable production plans.

목차

Abstract
1. 서론
2. 문헌 연구
2.1 이론적 배경
2.2 최종검사 운영 방식
3. 연구모델 및 방법론
4. 분석
4.1 Superset Configuration 활용
4.2 주간 선적량 보다 작업의 연속성을 고려
5. 결론
5.1 실무적 공헌도
5.2 발전 방향 제시
5.3 연구의 한계
5.4 미래 연굴 방향 제시
References

저자정보

  • 이호경 Hokyoung Lee. 시냅틱스 코리아

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