earticle

논문검색

반도체 설계 공정 D-FMEA를 통한 RCT(Root cause tracker) 시스템 구축에 관한 실증 연구

원문정보

A study on the establishment of RCT(root cause tracker) system through D-FMEA in semiconductor design

최영중, 박재현, 송관배

피인용수 : 0(자료제공 : 네이버학술정보)

초록

영어

Semiconductor is one of the biggest export items in Korea and one of future foods. In this study, the development of the product due to the repetition of the engineer mistakes repeatedly occurred due to the experience and habit of the individual in the semiconductor design process until now, resulting in an increase in the development period of the product and the economic loss of sales. As a result, the need for database of engineers' knowledge and know-how has emerged. This study investigate show to integrate and utilize data that is not managed on On/off-line for semiconductor knowledge and know-how. To do this, we intend to construct a RCT(RootCauseTracker) system that enables statistical analysis of the data on design failure accumulated over the previous year in any company.

목차

Abstract
1. 서론
1.1 연구 목적과 필요성
1.2 연구수행 방법 및 구성
2. 이론적 고찰
2.1 통계적 기법의 고찰
2.2 반도체 산업의 이해
2.3 반도체 설계분야의 중요성
3. RCT 모형의 개발
3.1 구축 시스템 모형설계
3.2 D-FMEA
4. RCT 시스템 구축
4.1 D-FMEA 수행
4.2 RCT 시스템 적용
4.3 RCT 시스템 도입 결과
5. 결론 및 향후 연구과제

저자정보

  • 최영중 Young-Jung Choi. SK하이닉스(주)
  • 박재현 Jea-Hyun Park. 한국산업인력공단
  • 송관배 Kwan-Bae Song. 명지대학교 산업경영공학과

참고문헌

자료제공 : 네이버학술정보

    ※ 기관로그인 시 무료 이용이 가능합니다.

    • 4,000원

    0개의 논문이 장바구니에 담겼습니다.