earticle

영어

The widespread use of capacitors in compact, high-performance electronics has heightened concerns regarding fire risks under thermal stress. This study experimentally investigated the degradation of various capacitor types at elevated temperatures to evaluate their ignition potential. Results showed that stepwise heating induced significant capacitance fluctuations, structural deformation, and dielectric leakage. Microscopic analysis via SEM-EDS confirmed the presence of carbon-rich residues in the leaked materials, which facilitate the formation of conductive paths and promote electrical tracking. Furthermore, the combination of leaked substances and narrow lead spacing compromised insulation reliability, thereby increasing the risk of arc discharges. These findings demonstrate that thermal degradation and dielectric leakage are critical precursors to tracking and ignition, providing substantiated forensic evidence for capacitor-related fire investigations.