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논문검색

Transient loss analysis of non-insulation high temperature superconducting coil using the field-based data profiling method

초록

영어

The evaluation of no-insulation (NI) high-temperature superconducting (HTS) typically uses the lumped equivalent circuit (LEC) model. Constant parameters in the NI HTS LEC model accurately predict voltage and central magnetic field at currents below the critical current. However, it is difficult to find constant circuit parameters that simultaneously satisfy the measured voltage and magnetic field under overcurrent conditions. Recent research highlights changes in contact resistance during transient conditions, which may impact power loss estimation in NI HTS coils. Therefore, we confirm the influence of contact resistance changes on loss calculation in the transient state for NI HTS coil. To achieve this, we introduce a measurement data analysis method based on the LEC model and compare it with the LEC model using constant circuit parameters.

목차

Abstract
1. INTRODUCTION
2. LUMPED-EQUIVALENT CIRCUIT MODEL AND DATA PROFILING METHOD
2.1. Lumped-equivalent circuit model of NI HTS coil
2.2. Field-based data profiling analysis method
3. ANALYSIS RESULTS OF OVER-CURRENT EPXRIMENT
3.1. Comparison with Experimental and LEC Simulation Results
3.2. Comparison with Experimental and LEC Simulation Results
4. CONCLUSION
ACKNOWLEDGMENT
REFERENCES

저자정보

  • Hoon Jung Department of Electrical & Energy Engineering, Jeju National University, Jeju, 63243, Korea
  • Yoon Seok Chae Department of Electrical & Energy Engineering, Jeju National University, Jeju, 63243, Korea
  • June Hee Han Department of Electrical & Energy Engineering, Jeju National University, Jeju, 63243, Korea
  • Ji Hyung Kim Electric Energy Research Center, Jeju National University, Jeju, 63243, Korea
  • Seung Hoon Lee Electric Energy Research Center, Jeju National University, Jeju, 63243, Korea
  • Ho Chan Kim Department of Electrical & Energy Engineering, Jeju National University, Jeju, 63243, Korea
  • Young Soo Yoon Department of Electrical Engineering, Shin Ansan University, Ansan, South Korea
  • Ho Min Kim Department of Electrical & Energy Engineering, Jeju National University, Jeju, 63243, Korea

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