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The idea of ensemble learning is to train multiple models, each with the objective to predict or classify a set of results. Most of the errors from a model’s learning are from three main factors: variance, noise, and bias. By using ensemble methods, we’re able to increase the stability of the final model and reduce the errors mentioned previously. By combining many models, we’re able to reduce the variance, even when they are individually not great. In this paper we propose an ensemble model and applied it to classification problem. In iris, Pima indian diabeit and semiconductor fault detection problem, proposed model classifies well compared to traditional single classifier that is logistic regression, SVM and random forest .