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논문검색

반도체 장비 PM 결과에 대한 자동검사 시스템 구축에 관한 실증연구

원문정보

A Study on the Construction of Automatic Inspection System for Semiconductor Equipment PM Results

임철, 박재현, 송관배

피인용수 : 0(자료제공 : 네이버학술정보)

초록

영어

In order to secure competitiveness of companies in the semiconductor industry, state management of equipment is one of the most important key factors. Particularly, after carrying out preventive maintenance (PM) work to maintain the best equipment condition, process reliability inspection is carried out. This work must be performed manually by the intervention of the operator. This inspection work is becoming more and more difficult due to the difficulty of the manufacturing worker, the increase of the simple repetitive workload, and the increase of the inspection items for the engineer, as the condition and the procedure continuously change as the semiconductor scaling down. Therefore, we would like to carry out an empirical study on the construction of an automatic inspection system in order to carry out the more reliable and efficient inspection procedure by eliminating the problems and unreasonableness of the past based on the investigation and analysis of the work procedures and conditions of the existing manual method.

목차

Abstract
1. 서론
2. 이론적 고찰
2.1 설비보전
2.2 반도체 제조 공정
2.3 제조실행시스템(MES)
3. 수작업 검사 시스템 분석
3.1 수작업 검사 절차 현황
3.2. 수작업 검사 문제점 및 대책
4. 자동검사 시스템 구축
4.1 자동검사 시스템 개요
4.2 자동검사 및 연계 시스템 설계
4.3 기준정보 및 실행 Module 설계
4.4 자동검사 시스템 구축 및 적용
5. 결론
6. References

저자정보

  • 임철 Cheol Im. SK하이닉스(주)
  • 박재현 Jea-Hyun Park. 한국산업인력공단
  • 송관배 Kwan-Bae Song. 명지대학교 산업경영공학과

참고문헌

자료제공 : 네이버학술정보

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