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논문검색

MEMD Interval Threshold Filter and Twin SVM for Electromagnetic Template Attack

초록

영어

To overcome the dependence on prior knowledge of traditional filtering algorithm, this paper proposes a novel non-parameter and adaptive multivariate empirical mode decomposition interval threshold (MEMD-IT) denoising approach for signal preprocessing of electromagnetic template attack(ETA). MEMD-IT can reduce the discontinuity induced by traditional MEMD-DT and aims to remove the Gaussian noise coupled into side-channel electromagnetic radiations. The proposed method and some other filters such as butterworth low-pass filter(BLPF),wavelet threshold denoising and MEMD direct threshold (MEMD-DT) denoising are applied to analyze the electromagnetic radiation traces intercepted while cipher device was implementing RC4 encryption algorithm. Furthermore, twin SVM multi-class classifier based ETA was performed to evaluate the attack results. In the same attack scenario, the highest predictive success rate for 9 Hamming Weights of the key reached 92%,90%,84%,83% and 73% for MEMD-IT, WFTF, MEMD-DT,WULETF and BLPF preprocessing methods, respectively. The experiment results indicate that our proposed scheme has a significant performance compared with the traditional ETA.

목차

Abstract
 1. Introduction
 2. MEMD Based Denoising
  2.1. Criterion of Selecting Relevant Modes
  2.2. MEMD Interval Threshold Denoising
 3. Electromagnetic Radiations Preprocessing Based on MEMD-IT
  3.1. Electromagnetic Radiations Interception
  3.2. Preprocessing Based on MEMD-IT
 4. Electromagnetic Side-Channel Attack Analysis Based on TWSVM
  4.1. Feature Selection of the Traces
  4.2. Side-Channel Analysis Based on TWSVM
 5. Conclusion
 References

저자정보

  • Duan Li School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China / School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo, China
  • Hong-xin Zhang School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China / 3Beijing Key Laboratory of Work Safety Intelligent Monitoring (Beijing University of Posts and Telecommunications), Beijing, China
  • Qiang Li School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China
  • Xinjie Zhao Institute of North Electronic Equipment, Beijing, China
  • Pengfei He School of Opto-electronic Information Science and Technology, Yantai University, Yantai, China

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