원문정보
보안공학연구지원센터(IJFGCN)
International Journal of Future Generation Communication and Networking
Vol.9 No.9
2016.09
pp.1-14
피인용수 : 0건 (자료제공 : 네이버학술정보)
목차
Abstract
1. Introduction
2. IGBT Failure Mechanism
2.1. Failure Related to Chip
2.2. Failure Related to Packaging
3. Experiment Analysis of IGBT Accelerated Degradation
4. Degradation Feature Selection and Data Preprocessing of IGBT
5. IGBT Health Prediction of Process Neural Network based on LM Optimization
5.1. The Topology Structure of Process Neural Network
5.2. Orthogonal basis Expansion of Process Neural Network Model
5.3. LM Learning Algorithm Optimization Process based on the Orthogonal Basis Expansion
6. IGBT Health State Parameter Prediction
7. Conclusion
References
1. Introduction
2. IGBT Failure Mechanism
2.1. Failure Related to Chip
2.2. Failure Related to Packaging
3. Experiment Analysis of IGBT Accelerated Degradation
4. Degradation Feature Selection and Data Preprocessing of IGBT
5. IGBT Health Prediction of Process Neural Network based on LM Optimization
5.1. The Topology Structure of Process Neural Network
5.2. Orthogonal basis Expansion of Process Neural Network Model
5.3. LM Learning Algorithm Optimization Process based on the Orthogonal Basis Expansion
6. IGBT Health State Parameter Prediction
7. Conclusion
References
저자정보
참고문헌
자료제공 : 네이버학술정보