원문정보
보안공학연구지원센터(IJUNESST)
International Journal of u- and e- Service, Science and Technology
Vol.9 No.6
2016.06
pp.377-388
피인용수 : 0건 (자료제공 : 네이버학술정보)
목차
Abstract
1. Introduction
2. The Equivalent Transformation of Multiple Stuck-at Faults and Single Stuck-at Fault
3. Neural Network Model for Single Stuck-at Fault
4. Algorithm’s Realization
4.1. Simplify the Energy Function of Constraint Circuit
4.2. Solving the Zero Value of Energy Function with Artificial Bee Colony Algorithm
5. Experiment Results
6. Conclusion
Acknowledgements
References
1. Introduction
2. The Equivalent Transformation of Multiple Stuck-at Faults and Single Stuck-at Fault
3. Neural Network Model for Single Stuck-at Fault
4. Algorithm’s Realization
4.1. Simplify the Energy Function of Constraint Circuit
4.2. Solving the Zero Value of Energy Function with Artificial Bee Colony Algorithm
5. Experiment Results
6. Conclusion
Acknowledgements
References
저자정보
참고문헌
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