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논문검색

Highly Reliable Product Code for Error Correction

초록

영어

In storage and communication systems, the product and concatenation codes, which consist of Reed–Solomon (RS) codes and other error-correction codes, can be utilized to effectively correct burst errors by performing erasures-and-errors decoding. However, the RS codes have two drawbacks: 1) the RS decoders may not detect received erroneous codewords, and 2) the RS decoders may generate valid codewords which are not equal to the transmitted codewords. In the implementation of the product and concatenation codes, such decoding drawbacks can cause the RS code to provide incorrect error-detection information or erasure information to other error-correction codes, resulting in unreliable error-correction performance of the systems. In this study, we propose a new product code to overcome these drawbacks by studying the RS product code (RSPC). The new code combines CRC code with RSPC which is called as CRSPC. In addition, the results of experiments show that the new CRSPC can significantly reduce the probabilities of these drawbacks, thereby improving the performance of erasures-and-errors decoding. With minor modifications, the CRSPC algorithm can be applied to Blue-ray disc systems which have powerful recording functions in multimedia.

목차

Abstract
 1. Introduction
 2. The Upper Bound Probabilities of the Two Drawbacks
  2.1. The Upper Bound Probability of Undetected Error
  2.2. The Upper Bound Probability of Decoding Error
 3. New Product Code
  3.1. The Drawbacks Degrade the Performance of RSPC
  3.2. The Structure of the CRSPC
 4. Performance Comparison between the RSPC and CRSPC
  4.1. Comparison in Theory
  4.2. Comparison in Experiment
 5. Conclusions
 Acknowledgements
 References

저자정보

  • Bingrui Wang School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
  • Xiaofei Yang School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
  • Xingzhong Yao Laboratory of Precision-Guided Technology, Second Artillery Command College, Wuhan, China
  • Hongzhi Zhang Department of Mathematics and Statistics, Hubei University of Economics, Wuhan, China
  • Yue Zhang School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China

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