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논문검색

Research on SOC Test Bus Allocation Algorithm under the Constraint of Temperature

원문정보

Xiaomin Li, Shuanghua Huang

보안공학연구지원센터(IJHIT) International Journal of Hybrid Information Technology Vol.8 No.8 2015.08 pp.167-174
피인용수 : 0건 (자료제공 : 네이버학술정보)

초록

영어

The main concern is over rising temperature during the testing of complex system-on-chip (SOC), this paper studies SOC wrapper and test access mechanism (TAM), and proposes an improved algorithm of TAM assignment under the constraints of temperature. The algorithm uses temperature superposition method and adds compression process. This algorithm can find the test structure that uses shorter test time.

목차

Abstract
 1. Introduction
 2. Test Case and Test Access Mechanism for Joint Design Algorithm
 3. TAM Bus Allocation Algorithm
 4. Simulation Results and Analysis
 5. Conclusion
 References

키워드

저자정보

  • Xiaomin Li Department of Electronic Engineering, Navy University of Engineering, Wuhan 430033, China
  • Shuanghua Huang Department of Electronic Engineering, Navy University of Engineering, Wuhan 430033, China

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자료제공 : 네이버학술정보

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