earticle

논문검색

Measurement Algorithm of Clock Jitter Based on Sequential Equivalent Sampling

초록

영어

For the problem that general characteristic impedance measurement instrument is difficult to measure the size of clock jitter, this paper proposes a measurement algorithm to achieve clock jitter based on sequential equivalent sampling. First, according to the relationship between the equivalent sampling signal and the average signal, we count up the probability density distribution of the clock jitter and use the Tailfit jitter separation techniques to decompose total jitter (TJ) into deterministic jitter (DJ) and random jitter (RJ), then count up the peak-to-peak values of periodic jitter (PJ), cycle-to-cycle jitter (CCJ) and time interval error (TIE) to achieve a precise measurement of clock jitter. Finally we use the test results of jitter analysis software of Tektronix’s TDSJIT3 as a reference to verify the effectiveness of the algorithm. This algorithm provides quantitative analysis means for the stability of characteristic impedance measurement instrument, and provides the reference basis for self-calibration circuit design of subsequent hardware.

목차

Abstract
 1. Introduction
 2. Jitter Model and Jitter Separation Method
  2.1 Jitter Model
  2.2 Jitter Separation Method
 3. Clock Jitter Measurement Algorithm based on Sequential Equivalent Sampling
  3.1 The Principle of Sequential Equivalent Sampling
  3.2 Clock Jitter Measurement Algorithm Based on the Principle of Sequential Equivalent Sampling
 4. Analysis of Measurement Result
 5. Conclusions
 Acknowledgements
 References

저자정보

  • Feijiang Huang Department of Electronic Information and Electrical Engineering, Changsha University, Changsha, 410022, China
  • Binxia Du School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu, 611731, China
  • Yong Cao School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu, 611731, China
  • Gun Li School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu, 611731, China

참고문헌

자료제공 : 네이버학술정보

    함께 이용한 논문

      ※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.

      0개의 논문이 장바구니에 담겼습니다.