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GUI Reliability Assessment based on Bayesian Network and Structural Profile

초록

영어

Graphical User Interfaces (GUI) is becoming increasingly important in the software field as it builds a friendly way between users and software through continuous interactions. A well-developed GUI is therefore an important factor of software quality. In particular, the reliability of GUIs is still on the way of development. Existing software reliability assessment techniques attempt to statistically describe the software testing process and predict the reliability of the system. However, those techniques are not suitable for GUI as quality of GUI is challenged by immense number of event interactions and complex structural profile etc. Furthermore, GUI has a wealth of information about GUI architecture, components, windows and their interactions with each other, which can be adopted to guide the testing process and establish confidence assessment of GUI. In this paper, a Bayesian network model of GUI reliability is introduced to discuss the reliability model topology and its issues encountered in the modeling process. A case is also presented to verify the validity of the model during the GUI reliability assessment process.

목차

Abstract
 1. Introduction
 2. Ralated Work
  2.1 GUI testing
  2.2 GUI and Event
  2.3 EFG
  2.4 Event Handler and HIG
  2.5 Test Cases
  2.6 Main window, modal window and modeless window
 3. GUI Structural Profile
  3.1 A Simple Event Profile of GUI
  3.2 Transition Matrix
  3.3 GUI Structural Profile
  3.4 Operational Profile
  3.5 Functional Profile
 4. Bayeisan Network Reliability Model of GUI
  4.1 Assumption of Model
  4.2 A Simple Bayesian Network
  4.3 The Topology of Bayesian network
 5. Mathematical Analysis of the Bayesian Model
  5.1 Parameter Learning and Data Updating Process
  5.2 Complete Data Parameters Estimated
 6. Case Study
  6.1 Assessment Process
  6.2 A Real Bayesian Model
  6.3 Basic Results
  6.4 The GUI Failure Detection Rate Influenced by Function Interaction:
 7. Conclusion and Future
 References

저자정보

  • Zhi-Fang Yang School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics
  • Zhong-Xing Yu School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics
  • Bei-Bei Yin School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics
  • Cheng-Gang Bai School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics

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