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Deposition and XPS Study of Pb, Zr, and Ti Films

초록

영어

Lead zirconate titanate (PZT) is significant material in electrical and optical devices for their ferroelectric, piezoelectric and dielectric properties. In this research, PZT films were fabricated by reactive RF co-sputtering method using Pb, Zr, and Ti targets. From XPS study, lead, zirconium, and titanium are successfully deposited on Si(100) substrate. Thickness of PZT films was measured with a surface profiler and the thickness was decreased as the oxygen gas ratio increased in the sputter gas.

목차

Abstract
 1. Introduction
 2. Experimental Section
 3. Results and Discussion
  3.1. Optimization
  3.2. Deposition of PZT Films
 4. Conclusions
 Acknowledgements
 References

저자정보

  • Sujin Choi Department of Chemistry, Pukyong National University, 45 Yongso- Ro, Nam-Gu, Busan 608-737, South Korea
  • Juyun Park Department of Chemistry, Pukyong National University, 45 Yongso- Ro, Nam-Gu, Busan 608-737, South Korea
  • Eunkang Jeong Department of Chemistry, Pukyong National University, 45 Yongso- Ro, Nam-Gu, Busan 608-737, South Korea
  • Beob jun Kim Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Seo yoon Son Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Jeong min Lee Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Jin seong Lee Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Hee jin Jo Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Jihun Park Busan IL Science High School, 242 Jeseok-Ro, Saha-Gu, Busan 604- 828, South Korea
  • Yong-Cheol Kang Department of Chemistry, Pukyong National University, 45 Yongso- Ro, Nam-Gu, Busan 608-737, South Korea

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