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An Entropy based Method for Defect Prediction in Software Product Lines

초록

영어

Determining when software testing should begin and the number of resources that may be required in order to find and fix defects are complicated decisions. If we can predict the number of defects for an upcoming software product given the current development team, it will enable us to make better decisions. A majority of reported defects are managed and tracked using a defect life cycle, which tracks a defect throughout its lifetime. The process starts when the defect is found and ends when the resolution is verified and the defect is closed. Defects transition through different states according to the evolution of the project, which involves testing, debugging, verification. In paper, we presents defect prediction model for consecutive software products that is based on entropy.

목차

Abstract
 1. Introduction
 2. An Entropy based Defect Prediction Model
 3. Conclusions
 Acknowledgements
 References

저자정보

  • ChangKyun Jeon Department of Computer Science, Korea University, Seoul, South Korea
  • Chulhoon Byun Department of Computer Science, Korea University, Seoul, South Korea
  • NeungHoe Kim Department of Computer Science, Korea University, Seoul, South Korea
  • Hoh Peter In Department of Computer Science, Korea University, Seoul, South Korea

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