원문정보
보안공학연구지원센터(IJHIT)
International Journal of Hybrid Information Technology
Vol.7 No.2
2014.03
pp.95-102
피인용수 : 0건 (자료제공 : 네이버학술정보)
초록
영어
A testing system has been designed to detect the single event upset failure of SRAM chips in this paper: a visual test bench for failure monitoring is developed based on LabVIEW, it could perform the task of data acquisition, storage and results analysis. At the testing board, the test vectors based on March C- algorithm are written to the reference SRAM and the under-test SRAM through FPGA. NI HSDIO-6548 card is used to collect all the data from the SRAMs, judging whether SEU failure occurred according to comparison results. The system could accomplish the work of real-time monitoring the failure status and test process with a good extensibility.
목차
Abstract
1. Introduction
2. March C- algorithm Description
3. The Main Components and Principle of Testing System
3.1 The brief introduction of LabVIEW visual test platform
3.2 Test vectors ejected procedure
4. Test Process and Results Analysis
4.1 Functional simulation of the testing system
4.2 Test for SRAM chips
5. Conclusions
Acknowledgements
References
1. Introduction
2. March C- algorithm Description
3. The Main Components and Principle of Testing System
3.1 The brief introduction of LabVIEW visual test platform
3.2 Test vectors ejected procedure
4. Test Process and Results Analysis
4.1 Functional simulation of the testing system
4.2 Test for SRAM chips
5. Conclusions
Acknowledgements
References
저자정보
참고문헌
자료제공 : 네이버학술정보