원문정보
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초록
영어
This paper proposes a new programmable RF Built-In Self-Test (BIST) circuit for 5GHz Wireless LAN. It is fabricated using 0.18-μm SiGe technology. This circuit is useful for testability of GHz-band RF IC devices in a complete RF transceiver environment. The proposed circuit helps it to provide DC output voltages and accurate phase difference. It contains two peak detectors and a phase detector. The proposed circuit showed excellent performance.
목차
Abstract
1. Introduction
2. Circuit Design and Analysis
3. Measurement Results
3.1. Band-Gap Reference Circuit
3.2. Test Amplifier
3.3. Peak and Phase Detectors
3.4. RF BIST Circuit
4. Conclusions
Acknowledgements
References
1. Introduction
2. Circuit Design and Analysis
3. Measurement Results
3.1. Band-Gap Reference Circuit
3.2. Test Amplifier
3.3. Peak and Phase Detectors
3.4. RF BIST Circuit
4. Conclusions
Acknowledgements
References
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자료제공 : 네이버학술정보