원문정보
보안공학연구지원센터(IJSIP)
International Journal of Signal Processing, Image Processing and Pattern Recognition
Vol.7 No.1
2014.02
pp.77-86
피인용수 : 0건 (자료제공 : 네이버학술정보)
초록
영어
This paper utilizes a 0 Ohm substitution current probe to measure the emission on the power network of an integrated circuit (IC). The measurement result shows that current probe works up to 1GHz, and the short time FFT (STFFT) method is used to identify the emission source. All the wideband emissions are from DC/DC converter, and no narrowband emissions are found. The measurement method gives great convenience to measure the current emission on printed circuit board (PCB) trace.
목차
Abstract
1. Introduction
2. Simulation Method to get the Mutual Inductance of the Probe
3. Mathematics Method to Obtain the Mutual Inductance of the Probe
3.1. Calculated and Measurement Results Comparison
4. Conducted Emission Measurement using Spectrum Analyzer
5. STFFT[11-12]
6. Current on Power Supply
7. Conclusions
Acknowledgments
References
1. Introduction
2. Simulation Method to get the Mutual Inductance of the Probe
3. Mathematics Method to Obtain the Mutual Inductance of the Probe
3.1. Calculated and Measurement Results Comparison
4. Conducted Emission Measurement using Spectrum Analyzer
5. STFFT[11-12]
6. Current on Power Supply
7. Conclusions
Acknowledgments
References
저자정보
참고문헌
자료제공 : 네이버학술정보