earticle

논문검색

Intrusion Trace Classification using Inter-element Dependency Models with k-Truncated Generalized Suffix Tree

원문정보

초록

영어

We present a scalable and accurate method for classifying program traces to detect system intrusion attempts. By employing inter-element dependency models to overcome the independence violation problem inherent in the Naïve Bayes learners, our method yields intrusion detectors with better accuracy. For efficient counting of n-gram features without losing accuracy, we use a k-truncated generalized suffix tree (k-TGST) for storing n-gram features. The k-TGST storage mechanism enables to scale up the classifiers, which cannot be easily achieved by SVM (Support Vector Machine) based methods that require implausible computing power and resources for accuracy.

목차

Abstract
 1. Introduction
 2. Method
  2.1. Inter-Dependency Models of n-Grams (IM(n))
  2.2. k-Truncated Suffix Tree
 3. Conclusion
 Acknowledgements
 References

저자정보

  • Dae-Ki Kang Division of Computer & Information Engineering, Dongseo University
  • Pilsung Kang Flash Solution Development Team, Memory Division Samsung Electronics

참고문헌

자료제공 : 네이버학술정보

    ※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.

    0개의 논문이 장바구니에 담겼습니다.