원문정보
초록
영어
Embedded systems are used to design and control variety of complex system. Now-a-days embedded system has been used in every aspect of our daily life such as automobiles, home appliances, cell phones, security system etc. It is also being used in highly safety critical system like aerospace, medical devices, military equipment etc. So it is necessary to test the system before being released. Usually in embedded system there are different modules which have a real time interaction between each other. The best and easiest way to make this relationship is by global variables. But in embedded software global variables potentially causes many issues such as lack of access control, implicit coupling and dependencies with different module of the source code. Large number of integration module and its associated global variables introduce the problem of scalability. This paper propose an automated test case generation approach to solve dependency problem considering the definition-use of global variable and generate scalable test cases according to feasible test sequences.
목차
1. Introduction
2. Testing usage patterns of global variables
2.1. Extended Call Graph
2.2. Combined CFG by reduction
3. Test sequence generation from Test Model
3.1. Determination of valid DU pair
3.2. Sequential Integration module Path with valid DU pair
3.3. Test case generation from test sequences
4. Empirical Study
5. Conclusion
Acknowledgements
References