원문정보
초록
영어
Surge current test data have been taken on as one important parameter among the process of the production and application of rectifier diode. According to the National Rectifying Diode Surge Current Testing Standards, surge current is usually generated from transformer and simultaneously tested by some testing special instruments, i.e. oscilloscopes. However, this kind of test can cause problems, such as extra high cost required, surge current waveforms distorted, and great influence made upon power grid fluctuations while high current tested. This paper addresses an efficient method to tackle those problems mentioned above. In this method, surge currents are generated by stored charges, then a microcomputer is adopted to control its surge waveform and the real time data are tested and displayed, such as the currents and voltages through the rectifier tube. Such technique can easily eliminate the effects of defects resulted from those surge current generated by transformer. Furthermore, it’s already proved to be much more accurate, controllable in surge time and peak. Compared with the method of surge current generated by transformer, such energy-stored method also saves more energy and occupies small volumes of space. Recently, instruments developed with this method have been applied in production testing systems in a number of related enterprises, and yield to a favorite effect.
목차
1. Introduction
2. Surge Current-generating and -testing System
2.1 Energy-stored SCT system structure
2.2 Charge storage of 5.0kA surge current
2.3 Controlling precision of the sine wave current with peak value of 5.0 kA
3. Comparison between Energy-stored Surge Current Method andTransformer Surge Method
4. Conclusions
Acknowledgements
References