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Testing and Debugging Concurrency Bugs in Event-Driven Programs

초록

영어

Event-driven programs are prone to concurrency bugs due their inherent nature of handling asynchronous events. Asynchronous events introduce logical concurrency into these programs making them hard to be thoroughly tested and debugged. However, understanding the root causes and characteristics of concurrency bugs can ease the debugging process and help developers to avoid introducing them. Unfortunately, previous taxonomies on concurrency bugs do not provide enough knowledge on event-driven concurrency bugs. This paper classifies the event-driven program models into low and high level according to the type of events they handle, categorizes concurrency bug patterns and surveys existing techniques to detect them in event-driven programs.

목차

Abstract
 1. Introduction
 2. Background
  2.1. Events and Programs
  2.2. Motivation
 3. Concurrency Bug Classification
  3.1. Data Races
  3.2. Atomicity and Order Violations
  3.3. Deadlocks
 4. Debugging Event-Driven Programs
  4.1. Detection Techniques
  4.2. Correction Techniques
 5. Conclusion
 Acknowledgement
 References

저자정보

  • Guy Martin Tchamgoue Department of Informatics, Gyeongsang National University
  • Kyong-Hoon Kim Department of Informatics, Gyeongsang National University
  • Yong-Kee Jun Department of Informatics, Gyeongsang National University

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