earticle

논문검색

Amorphous Slack Methodology for Autonomous Fault-Handling in Reconfigurable Devices

초록

영어

Amorphous Slack fault handling methodology utilizes adaptive runtime redundancy to improve survivability of FPGA based designs. Unlike conventional static redundancy based methods to achieve fault resilience, the proposed system operates in uniplex arrangement under non-contingent conditions. The proposed fault isolation algorithm is invoked upon fault detection which employs a health metric of the application operating over reconfigurable platform. This assertion applies if a signal-to-noise metric is known, as well as applications that do not possess a readily correlated metric to identify anomalous behavior. In particular, readily available processor cores allow dynamic fault identification by executing a software specification of the signal processing algorithm which is used to periodically validate critical outputs of the high-speed hardware circuit within tolerances. The results from H.263 video encoder and Canny edge detector implemented over Xilinx Virtex-4 device demonstrate autonomous recovery from permanent stuck-at faults while maintaining the throughput during fault-handling operations. The fault-detection and isolation applications are executed on on-chip PowerPC processor while the Circuit-Under-Test (CUT) is realized in hardware fabric. The proposed architecture allows on-chip processor based functional monitoring of the contained hardware resources subjected to the actual inputs of the circuit.

목차

Abstract
 1. Introduction
 2. Related Work
 3. Amorphous Slack Approach
  3.1. Fault Detection Mechanism
  3.2. Fault Isolation Algorithm
 4. Experiment Setup-1: H.263 Video Encoder
  4.1. The PowerPC 405 Processor
  4.2. Double Data Rate (DDR) Memory
  4.3. Peripherals in the processor-based system
 5. Experiment Setup-2: Canny Edge Detector
 6. Conclusions
 References

저자정보

  • Naveed Imran Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, 32816 USA
  • Jooheung Lee Department of Electronic and Electrical Engineering, Hongik University, Korea
  • Youngju Kim Department of Electronic and Electrical Engineering, Hongik University, Korea
  • Mingjie Lin Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, 32816 USA
  • Ronald F. DeMara Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, 32816 USA

참고문헌

자료제공 : 네이버학술정보

    함께 이용한 논문

      ※ 원문제공기관과의 협약기간이 종료되어 열람이 제한될 수 있습니다.

      0개의 논문이 장바구니에 담겼습니다.