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논문검색

Evaluation of Critical Current Density of FeAs-based Superconductors

원문정보

Edmund S. Otabe, Masaru Kiuchi, Teruo Matsushita, Baorong Ni, Yanpeng Qi, Lei Wang, Zhaoshun Gao, Dongliang Wang, Xianping Zhang, Yanwei Ma, Yasuyuki Nakajima, Tsuyoshi Tamegai

한국초전도저온학회 (구 한국초전도저온공학회) 한국초전도·저온논문지 (구 한국초전도저온공학회논문지) Vol.14 No.2 2012.05 pp.1-7
피인용수 : 0건 (자료제공 : 네이버학술정보)

초록

영어

In this review paper, we report the characteristics of the critical current density in FeAs based superconductors which is newly discovered by Hosono group of Tokyo Institute of Technology on 2008. Since the many specimens in present stage are not single crystals, there are two kinds of critical current density observed in the specimens which are so-called local and global critical current densities. Therefore, it is necessary to evaluate both kinds of critical current densities. The history effect in which the global critical current density shows different values in increasing and decreasing magnetic field is also observed when the specimens have the local and the global critical current densities. The wire which critical current is 180 A is successfully developed with using the knowledge of abovementioned characteristics of two kinds of critical current densities and the history effect.

목차

Abstract
 1. INTRODUCTION
 2. LOCAL AND GLOBAL CRITICAL CURRENT DENSITIES
  2.1. Experiments and Analysis
 3. HISTORY EFFECT IN CRITICAL CURRENT DENSITY
  3.1. Experiments and Analysis
  3.2. Results and Discussion
 4. CONDENSATION ENERGY DENSITY
  4.1. Experiments and Analysis
  4.2. Results and Discussion
 5. DEVELOPMENT OF WIRE AND ENHANCEMENT OF CRITICAL CURRENT
 6. CONCLUSIONS
 REFERENCES

저자정보

  • Edmund S. Otabe Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • Masaru Kiuchi Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • Teruo Matsushita Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • Baorong Ni Department of Information Electronics, Fukuoka Institute of Technology
  • Yanpeng Qi Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Lei Wang Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Zhaoshun Gao Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Dongliang Wang Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Xianping Zhang Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Yanwei Ma Institute of Electrical Engineering, Chinese Academy of Science, P. 0. Box 2703, Beijing 100190, China
  • Yasuyuki Nakajima Department Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
  • Tsuyoshi Tamegai TRIP-JST, Japan Science and Technology Agency, 7 Gobancho, Chiyoda-ku, Tokyo 102-0076, Japan

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