earticle

영어

The SRGM has been studied under the assumption that S/W reliability can grow as the fault causing failure is removed even during operational phase because the debugging is available. On the other hand, some papers insist on the uniform failure rate during operational phase because the debugging may not be available in case of universal software. The phenomenon, however, has been observed informally many times that the products S/W reliability grows as the time goes by even without any debugging in point of customer view.
I propose the simple approaching method to model the S/W reliability phenomenon that the failure rate reduces as time goes on without modifying the existing reliability model in this paper.