원문정보
피인용수 : 0건 (자료제공 : 네이버학술정보)
초록
영어
Various types of smart dust based on photonic crystal exhibiting unique reflectivity were successfully obtained by an electrochemical etching of silicon wafer using square wave currents. Smart dust containing Bragg structure obtained from the sonication of DBR porous silicon film in solution retained its optical reflectivity. Field emission scanning electron micrograph (FE-SEM) was used to measure the size of optically encoded smart dust and its size can be tuned from few hundred nanometers to few microns depending on the duration of sonication. Optical characteristics of smart dust were used to investigate a possible applications such as chemical sensors.
목차
Abstract
1. Introduction
2. Experimental Section
2.1. Preparation of DBR PSi
2.2. Instrumentation and data acquisition
3. Result and Discussion
4. Conclusion
References
1. Introduction
2. Experimental Section
2.1. Preparation of DBR PSi
2.2. Instrumentation and data acquisition
3. Result and Discussion
4. Conclusion
References
저자정보
참고문헌
자료제공 : 네이버학술정보