원문정보
The Characteristic of SnO2 Thin Films Grown by LP-Thermal MOCVD
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초록
영어
This report examines the variation on structural properties of SnO2 thin films .TEM studies shows some of the interfaces to be atomically faceted. Secondary X-ray photoelectron Spectroscopy Analysis(XPS) depth profiles show that films have a uniform composition along the depth.
목차
Abstract
1. 서론
2. 실험방법
3. 결과 및 고찰
4. 결론
참고문헌
1. 서론
2. 실험방법
3. 결과 및 고찰
4. 결론
참고문헌
키워드
저자정보
참고문헌
자료제공 : 네이버학술정보