earticle

영어

The exposure of integrated electronic components and systems to ionizing radiation may lead to minor deterioration in performance or catastrophic system failure, depending on the level of radiation (as a function of altitude). Mitigation of the radiation-induced hazards is of a major concern for space applications, since electronic components are expected to function without failure for an extended period of time, under extreme operating conditions. The work presented in this paper examines the effect of radiation on electronic components through analytical modeling of parameters, some of which are design-dependent and others are process-dependent. Examinations of the inter-dependency of these parameters would aid identifying possible solutions to the radiation tolerance problem.